The Circular Mode AFM

A New Experimental Approach for Investigating Nano-Tribology

Authored by: Olivier Noel , Nguyen Anh Dung , Pierre-Emmanuel Mazeran

21 Century Nanoscience – A Handbook

Print publication date:  April  2020
Online publication date:  April  2020

Print ISBN: 9780815384731
eBook ISBN: 9780429340420
Adobe ISBN:


 Download Chapter



The atomic force microscopy (AFM) is a versatile instrument that undoubtedly contributes to the development of the nanosciences. This chapter deals with a new technological breakthrough based on the AFM to study nano-tribology: the circular-mode AFM (CM-AFM). It consists in modifying the electronics of the AFM to generate a relative circular displacement of the AFM tip/sample contact. Unlike the traditional AFM modes, the CM-AFM allows performing friction force measurements in a quasi-stationary regime with a high sliding velocity (higher than 1mm/s). Advantages and limitations of the CM-AFM are discussed. Finally, applications of the CM-AFM for investigating friction mechanisms of hydrophilic and viscoelastic surfaces, nano-wear mechanisms and mechanical properties of cell membranes are reported.

Search for more...
Back to top

Use of cookies on this website

We are using cookies to provide statistics that help us give you the best experience of our site. You can find out more in our Privacy Policy. By continuing to use the site you are agreeing to our use of cookies.