ABSTRACT

Power semiconductor devices are the key enabling technology for power conversion applications. In order for power conversion system designers to fully utilize the performance advantages of next generation, high-performance power devices, well-characterized device test beds, and compact models are needed in system simulators, and model parameter extraction tools are required to characterize commercial power device products. The development of compact models is especially important for extreme environment applications, where testing and validation of power electronic circuits under application conditions can be practically impossible, especially for simultaneous stressors, for example, extreme temperature and radiation. Therefore, careful characterization and model implementation must reflect each independent environmental variable accurately in part and on the whole.