ABSTRACT
Radiation-enabled modeling and simulation of analog/mixed signal (AMS) circuits includes a number of factors to be considered, ranging from the environment of interest, what type of model includes the desired fidelity, the best application of the model, and what type of simulation coverage is needed. In this section, we will discuss modeling and simulation of mixed signal circuits in both parametric degrading and transient perturbation inducing radiation environments. A few common modeling methods and available models for the different environments as well as trade-offs between transistor-level and macro/behavioral modeling approaches for the environments will be discussed.
