Comparative Analysis of Mobility and Dopant Number Fluctuation Models for the Threshold Voltage Fluctuation Estimation in 45 nm Channel Length MOSFET Device

Authored by: Nabil Ashraf , Dragica Vasileska , Gilson Wirth , Purushothaman Srinivasan

Nanoelectronic Device Applications Handbook

Print publication date:  June  2013
Online publication date:  March  2017

Print ISBN: 9781466565234
eBook ISBN: 9781466565241
Adobe ISBN:

10.1201/b15035-4

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