Characterization of Gate-All-Around Si-Nanowire Field-Effect Transistor

Extraction of Series Resistance and Capacitance–Voltage Behavior

Authored by: Yoon-Ha Jeong , Sang-Hyun Lee , Ye-Ram Kim , Rock-Hyun Baek , Dong-Won Kim , Jeong-Soo Lee , Dae Mann Kim

Nanoelectronic Device Applications Handbook

Print publication date:  June  2013
Online publication date:  March  2017

Print ISBN: 9781466565234
eBook ISBN: 9781466565241
Adobe ISBN:


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