Microwave Sensors for Non-Invasive Monitoring of Industrial Processes

Mems-Based Reflective Display Systems

Authored by: B. García-Baños , Jose M. Catalá-Civera , Antoni J. Canós , Felipe L. Peñaranda-Foix

Noval Advances in Microsystems Technologies and their Applications

Print publication date:  July  2013
Online publication date:  April  2016

Print ISBN: 9781466560666
eBook ISBN: 9781466560673
Adobe ISBN:

10.1201/b15283-18

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Abstract

14.1 Dielectric Properties of Materials

14.1.1 Interaction of Microwaves and Matter

14.1.2 Why Measure Dielectric Properties

14.1.3 Techniques for Dielectric Property Measurement

14.1.4 Examples of Measurements

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