Abstract

The current investigations show a new approach in applying AFM microscopy to visualize real 3D-high-resolution imaging of graphene layers deposited via chemical vapor deposition (CVD) technique (ICVD) on 123-YBCO superconducting surface. The accurate analysis of graphene surface topology indicated that the graphene thickness varies throughout the surface sample, which confirms that the rate of graphene deposition via CVD process is not unified. According to this information, we expect that conduction quality could be changed from point to point in the same surface of graphene deposit. Many of the structural and electrical parameters will be discussed and interpreted.